Observation of Microstructures by Diffraction Contrast Technique
Abstract: TEM diffraction contrast technique is considerably useful for observation of microstructures in comparatively thick specimens to which high-resolution TEM/STEM is not applicable and grasp of the features of specimens over wide area. In this article, mechanism of the diffraction-contrast imaging of lattice defects and its applications are concisely presented.
Key words: lattice defect, dislocation, column approximation, weak-beam dark-field imaging, inside-outside method