■Foreword

New Ideas for Internationalization and Fostering of Young Talented Scientists

Yoshio Bando

■Feature Articles: Novel Microscopic Characterization Techniques Using Nanoscale Ion Probes

Frontier of Novel Microscopy Using Nanoscale Ion Probes

Daisuke Fujita

Helium Ion Microscopy Technology for Characterization and Fabrication of Nano-Device Materials

Shinichi Ogawa

Development and Shared Use of Advanced Nanomaterial Evaluation Techniques Using Scanning Helium Ion Microscope

Keiko Onishi

Three Dimensional Nano Scale Image Analysis of Organic Materials Using TOF-SIMS

Shin-ichi Iida

Application of Scanning Ion Conductance Microscopy to Biosciences

Masato Nakajima and Tatsuo Ushiki

■Seto Award

Lorentz Microscopy for Observation of Vortices in Superconductors with “Direction-Free Magnetic Field Application System”

Ken Harada

■Reviews

Studies of Neural Circuit Structure by Analysis of Single Neuron Morphology

Takahiro Furuta

Electron Diffraction Microscope

Osamu Kamimura and Kazutoshi Gohara

■Lectures

Atmospheric Scanning Electron Microscope Observation of Cells Using a Charged Gold Labeling Technique

Hidetoshi Nishiyama, Kanae Teramoto, Mitsuo Suga and Chikara Sato

HRTEM, EELS and Ab-initio Calculation in Atomic and Electronic Structures of Pd/ZnO Polar Interfaces

Norihito Sakaguchi, Kei Watanabe and Yuji Kunisada

■Researches Today

PEEM and Its Future Challenge

Kiyotaka Asakura

Three-Dimensional Magnetic Field Tomography Using a Dual-Axis 360° Rotation Specimen Holder

Ruriko Tsuneta, Hideo Kashima, Ken Harada, Tomohiro Iwane, Masaki Ikeda, Akira Sugawara and Masanari Koguchi

Live-Cell Imaging of Endocytosis in the Budding Yeast

Junko Toshima and Jiro Toshima

Development and Application of a Brighter Chemiluminescent Protein for Bioimaging

Takeharu Nagai, Kenta Saito and Noriyuki Hatsugai

Application of Electron Channeling Contrast Imaging in a Scanning Electron Microscope for Dislocation Analysis

Masaaki Sugiyama and Genichi Shigesato

■Conference Reports

Report on Microscopy and Microanalysis 2013

Shinichi Ohno and Keisuke Ohta

Report on “Workshop on Advances in Transmission Electron Microscopy―Celebrating S. J. Pennycook 60th Birthday”

Eiji Abe

■Staff Commentary

Daisuke Fujita