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>> Vol.46, No.1, 2011 (Japanese)

Vol. 46  No. 1      2011
CONTENTS

■ Foreword

Biologists Who Can Analyze Electron Micrographs of Cells

Yasuo Uchiyama

■ Feature Articles: Applications of S/TEM Techniques to Chemistry of Catalysis

Introduction

Tomoki Akita

TEM Observation of the Interaction in Supported Precious Metal Catalysts

Naoto Kamiuchi, Toshiaki Matsui and Koichi Eguchi

TEM Study on Au Nano-Particle Catalysts

Tomoki Akita, Shingo Tanaka, Koji Tanaka, Masanori Kohyama and Masatake Haruta

Electron Microscopic Study of Heterogeneous Catalysts with 80 kV–1 MV Accelerating Voltage

Kenta Yoshida, Shigeo Arai, Koh Saitoh and Nobuo Tanaka

Environmental TEM Analysis for Catalysts

Keisuke Kishita

A Cs-Corrected Environmental Transmission Electron Microscope for Characterizing the Processes and Characteristics of Nanomaterials in Real Environments

Seiji Takeda, Hideto Yoshida, Yasufumi Kuwauchi and Stephan Kujawa

■ Seto Award

Application of Signal Processing and Statistical Processing to Electron Microscopic Datasets

Shunsuke Muto

Electron Microscopy Studies on Phase Transformations in Crystalline Solids

Yasukazu Murakami

Visualization Technologies of Neuronal Functions

Shigeo Okabe

Creation and Structure Control of Carbon Nanotube and Graphene by Suface Decomposition of SiC

Michiko Kusunoki

■ Reviews

Tooth Regeneration as a Next Generation of Organ Replacement Regenerative Therapies

Miho Ogawa, Masamitsu Oshima and Takashi Tsuji

Theory and Application of Atomic-Resolution Annular Bright-Field (ABF) STEM

Naoya Shibata, Scott D. Findlay and Yuichi Ikuhara

■ Lecture

Development of Scanning Confocal Electron Microscopy

Masaki Takeguchi, Ayako Hashimoto, Kazutaka Mitsuishi and Masayuki Shimojo

■ Researches Today

A Fluorescence Scanning Electron Microscope

Takaaki Kanemaru, Kazuho Hirata, Shin-ichi Takasu, Shin-ichiro Isobe, Keiji Mizuki, Shuntaro Mataka, Toshio Hisatomi, Syouji Noutomi and Kei-ichiro Nakamura

Development of 30-picoradian Positioning System for X-ray Interferometer and Its Application for Phase-Contrast X-ray Imaging

Akio Yoneyama, Satoshi Takeya, Kazuyuki Hyodo, Kazuhiro Ueda and Tohoru Takeda

Detection of Single Electron Spin by Using Scanning Tunneling Microscope (STM)

Tadahiro Komeda

■ Staff Commentary

Shunsuke Muto