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>> Vol.43, No.3, 2008 (Japanese)

Vol. 43  No. 3     2008
CONTENTS

■ Foreword

Joy of Microscope

Yosaburo Shibata

■ Feature Articles: Image formation and detection of signal in SEM

Introduction

Mika Yamashita

SEM Image Viewed from Simulated Behavior of Penetrating Electrons in Specimens

Tohru Ishitani

Illumination Effects and Image Contrasts Due to Various Electron Detectors in SEM

Akishige Ono and Masateru Shibata

Detection of Backscattered Electrons with a Deceleration System of the Incident Beam in SEM

Naoki Kikuchi

Introduce of the Signal Detection System Using ExB

Ryuichiro Tamochi and Shunya Watanabe

Signal Detection in a SEM with the Magnetic/Electrostatic Compound Lens System

Shigeaki Tachibana

Signal Detection in Low Vacuum Scanning Electron Microscopy

Miki Nakamura and Milos Toth

■ Reviews

Tunnel Conductance Measurements of Nano-regions Performed in Transmission Electron Microscopes

Masashi Arita, Kouichi Hamada, Ryusuke Hirose, Youhei Okubo and Yasuo Takahashi

Neuronal Network Linked by Gap Junctions

Takaichi Fukuda

■ Lectures

Functional Investigation Using Quantum Dot Multiple Staining

Johbu Itoh

Imaging Technique of Weak Luminescence and Fluorescence for Application on Life Science and Medicine

Masaki Kobayashi

Remote Control System for the Ultrahigh Voltage Electron Microscope

Kiyokazu Yoshida

Principles of TEM Image Formation (II)

Toyohiko Konno

■ Researches Today

Organization of Connectivity of the Rat Retrosplenial Cortex

Hideshi Shibata

Analysis on Dynamics of Carbon Nanomaterials under Electron Beam Irradiation

Masaaki Yasuda

Distribution of Copper in a Highly Copper-tolerant Yeast Observed Using Analytical Electron Microscopy

Katsuyuki Uematsu, Akira Inoue, Fumiyoshi Abe, Takeshi Miura and Koki Horikoshi

Three Dimensional Observation of the Vascular Networks in the Brain

Hisashi Hashimoto, Hiroshi Ishikawa, Moriaki Kusakabe

■ Conference Reports

The 64-th Annual Meeting of the Japanese Society of Microscopy

Seiji Isoda, Mari Dezawa and Hiroki Kurata

The 1st International Symposium on Advanced Microscopy and Theoretical Calculations (AMTC1)

Hirayama Tsukasa

■ Staff Commentary

Yoshihide Kimura