■Foreword

Chemical Identification and Manipulation of Individual Atoms toward Bottom-Up Nanostructuring at Room Temperature

Seizo Morita

■Feature Articles: Frontier of Advanced Scanning Probe Microscopy for Materials Research

Frontier of Scanning Probe Microscopy

Daisuke Fujita

Development of a Pencil-Type Scanning Probe Microscope

Masahiko Tomitori

Development of Femtosecond Time-Resolved STM—a Method Visualizing Ultrafast Phenomena

Shoji Yoshida, Osamu Takeuchi and Hidemi Shigekawa

High-Resolution Element Specific Analysis with Scanning Tunneling Microscope Assisted by Synchrotron Radiation Light

Toyoaki Eguchi, Taichi Okuda, Toyohiko Kinoshita and Yukio Hasegawa

Kelvin Probe Force Microscopy and Its Application to Evaluation of Thin Film Growth

Yasuhiro Sugawara, Hikaru Nomura, Yoshitaka Naitoh and Yan Jun Li

A Development of a High Resolution FM-AFM Working in Air or Solution

Ryohei Kokawa and Masahiro Ohta

■Reviews

Basics and Interpretation of Scanning-Ion-Microscope Images

Tohru Ishitani

Visualization of in situ Immune Responses

Kenjiro Matsuno and Hisashi Ueta

■Lectures

Visualizing Undercoat Structures Associated with the Adherent Membrane of Cultured Osteoclasts by Unroofing Freeze-Etching Techniques

Toshitaka Akisaka

Cryo-Electron Microscopy of Vitreous Sections

Kenji Iwasaki, Naoyuki Miyazaki, Yoshiko Ito and Junichi Takagi

■Researches Today

Local Electronic Structure Analysis by Using Site-Resolved STEM-EELS

Mitsutaka Haruta, Seiji Isoda and Hiroki Kurata

A New Histochemical Approach to Localize Methylation Sites of DNA: HELMET

Takehiko Koji

Development of Adaptive SEM Technology for in situ Molecular Expression Analysis in Single Cell Level Using Nano-Particle Probe Array Consisting of Various Elements

Hyonchol Kim, Hideyuki Terazono, Hiroyuki Takei and Kenji Yasuda

■Conference Reports

10th Asia-Pacific Conference on Microscopy

Kenji Matsuda

■Staff Commentary

Daisuke Fujita