Development of Z_eff Imaging Using X-ray Interferometer

Akio Yoneyama, Rika Baba, Satoshi Takeya, Kazuyuki Hyodo and Tohoru Takeda

Abstract: A novel Z_eff imaging using X-ray interferometer has been developed. Since the effective atomic number (Z_eff) corresponds to the ratio of the real to imaginary part of the complex refractive index, an elemental map is calculable with the ratio of an absorption and phase-contrast image. Several metal foils underwent feasibility observations by crystal X-ray interferometry. The obtained Z_eff image shows that aluminum, iron, nickel, and copper foil were clearly distinguished, and nickel and copper’s Z_eff values coincide with ideal Z number within 5%.

Key words: X-ray interferometer, Effective atomic number (Zeff), Phase-contrast X-ray imaging, Absorption-contrast X-ray imaging, Zeff imaging