KENBIKYO Vol.50▶No.1 2015
â– Researches Today

Development of Zeff Imaging Using X-ray Interferometer

Akio Yoneyama, Rika Baba, Satoshi Takeya, Kazuyuki Hyodo and Tohoru Takeda

Abstract: A novel Zeff imaging using X-ray interferometer has been developed. Since the effective atomic number (Zeff) corresponds to the ratio of the real to imaginary part of the complex refractive index, an elemental map is calculable with the ratio of an absorption and phase-contrast image. Several metal foils underwent feasibility observations by crystal X-ray interferometry. The obtained Zeff image shows that aluminum, iron, nickel, and copper foil were clearly distinguished, and nickel and copper’s Zeff values coincide with ideal Z number within 5%.

Key words: X-ray interferometer, Effective atomic number (Zeff), Phase-contrast X-ray imaging, Absorption-contrast X-ray imaging, Zeff imaging