MICROSCOPY Vol.44▶No.1 2009
â– Feature Articles: Application and Future Aspect of Electron Microscopy in Industry

Applications of ransmission electron microscopy in material characterization of ceramics

Takao Matsumoto and Yasuhiro Motoyoshi

Abstract: TEM/STEM is a powerful tool in evaluation of ceramics materials due to its high spatial and temporal resolution. Performances of devices using ceramics materials are affected by its electric and chemical structure at nanometer scale. In this manuscript, we will describe applications of TEM/STEM for ferroelectric domain analysis, atomic characterization at grain boundary, and in-situ observations of sintering process of BaTiO3 ceramics.

Key words: ceramics, ferroelectrics, grain boundary, polarization, ferroelectric domain