MICROSCOPY Vol.44▶No.2 2009
â– Researches Today

AFM Characterization for Mechanical Properties of Polymeric Materials

Ken Nakajima, So Fujinami and Toshio Nishi

Abstract: A novel characterization technique based on atomic force microscopy (AFM) is introduced, where AFM is utilized as nano-scale palpation technique. The technique maps surface mechanical properties of polymeric materials as well as their artifact-free true topographic images. Several analytical models those can be used in this technique and their applicable limits are also discussed. Finally, a example to exhibit the advantage of this technique is shown.

Key words: Atomic force microscopy, Nano-scale palpation, Polymeric material, Mechanical properties mapping