MICROSCOPY Vol.44▶No.4 2009
â– Lectures

Convergent-beam electron diffraction

Kenji Tsuda

Abstract: Convergent-beam electron diffraction (CBED) patterns are obtained by converging a conical electron beam on a nanometer-size specimen area. The CBED method enables us to determine specimen thicknesses, crystal symmetries, lattice parameters and strains, lattice defects and crystal structural parameters. Basics of the CBED method and tips for CBED experiments are described. Some applications of CBED are briefly outlined.

Key words: Convergent-beam electron diffraction (CBED), Zeroth-order Laue zone (ZOLZ) reflections, (Higher-order Laue zone (HOLZ) reflections, Point- and space-groups, crystal structure analysis