MICROSCOPY Vol.45▶No.2 2010
â– Reviews

Electron Tomography to Visualise Dislocations in Three-dimension

Masaki Tanaka, Kenji Higashida, Kenji Kaneko, Masatoshi Mitsuhara and Satoshi Hata

Abstract: In the present paper, recent progress of a novel method called electron tomography in the visualisation of dislocations was reviewed. The method of obtaining three-dimensional structure of dislocations was explained first. The applications of the electron tomography combining with electron microscopy such as dark-field, STEM, HVEM and dual-axis were also demonstrated.

Key words: electron tomography, dislocations, crack, lattice defect, STEM