MICROSCOPY Vol.46▶No.2 2011
â– Reviews

Valence Electron Spectroscopy Based on Electron Microscopy

Masami Terauchi

Institute of Multidisciplinary Research for Advanced Materials, Tohoku University

Abstract: Recent developments of X-ray emission spectroscopy instruments for electron microscopy for obtaining a density of states of valence bands are briefly described. The latest TEM-SXES instrument (ver.6) for 50-4000eV and its spectrum of Li-K emission are presented. An example of anisotropic N-K emission spectra obtained from a single crystalline h-BN is shown. From the spectra, density of states of π- and σ-bondings were separately derived. Those results demonstrated a method to analyze the electronic states of valence electrons of materials based of electron microscopy.

Key words: Soft-X-ray emission spectroscopy, valence electron, electron microscopy