MICROSCOPY Vol.47▶No.1 2012
â– Feature Articles: Frontier of Advanced Scanning Probe Microscopy for Materials Research

High-Resolution Element Specific Analysis with Scanning Tunneling Microscope Assisted by Synchrotron Radiation Light

Toyoaki Eguchi, Taichi Okuda, Toyohiko Kinoshita and Yukio Hasegawa

Abstract: Microscope having atomic resolution with chemical sensitivity is one of the ultimate microscopes for the material science. Scanning tunneling microscope (STM) assisted by the core-level excitation using synchrotron radiation (SR) may be a possible candidate of such an ultimate microscope. We have demonstrated that we can observe element specific images of surfaces in the spatial resolution of several tens of nanometer by detecting the secondary electrons produced by the electron-hole recombination after the core-level excitation with an STM tip and taking the photon-induced current images. Recently, we have modified the system in order not only to improve its performance but also to accommodate a focused beam of a newly renovated beamline. Here, we briefly report on the modification and future prospects of this method.

Key words: scanning tunneling microscope, synchrotron radiation light, elemental analysis, X-ray absorption spectrum