KENBIKYO Vol.49▶No.2 2014
â– Lectures

High Resolution Electronic State Analysis Using STEM-EELS

Mitsutaka Haruta

Abstract: Scanning transmission electron microscopy (STEM) combined with electron energy-loss spectroscopy (EELS) can not only identify atomic columns but also carry out elemental and electronic state mapping with atomic resolution. This paper describes recent results of high spatial resolution electronic state analysis for transition metal oxide using Cs-corrected STEM with some cautions for experiment and interpretation.

Key words: STEM, EELS