KENBIKYO Vol.52▶No.3 2017
■Feature Articles: Recent Topics of Magnetic Imaging

Spin-Polarized Scanning Electron Microscopy

Teruo Kohashi and Hideo Matsuyama

Abstract: Spin-Polarized Scanning Electron Microscopy (spin SEM) is one of the imaging tools of magnetic domain structures, which takes advantage of spin polarization of secondary electrons. Polarized orientation of the electron spin within ferromagnetic materials is the origin of the materials’ magnetization, and this spin polarization is maintained while the electrons are emitted as secondary electrons. The spin polarization of the secondary electrons is detected by the spin polarimeter, which is a key component of spin SEM.
In this article, we introduce the principle of the spin SEM, followed by the explanation of the structure and the advantages of this method. And we show several example of spin SEM measurements, such as visualization of spin structure of anti-ferro magnet NiO(001), and magnetization detection of grain boundary phase of NdFeB sintered magnet.

Key words: magnetic domain, spin polarization, secondary electrons, NdFeB