■ Foreword

Seeing is Believing: A New Era of Microscopy

Nobutaka Hirokawa

■ Feature Articles: Recent Progress of Semiconductor Surface Analysis by SPM-based Technologies

Recent Progress of Semiconductor Surface Analysis by SPM-based Technologies

Daisuke Fujita

Development of SEM based Nano-Probing System and Its Application

Yasuhiro Mitsui

1-nm High Resolution Scanning Spreading Resistance Microscope and Its Application to LSI Devices

Li Zhang

Semiconductor Dopant Profiling by Electrostatic Force Detection with AFM

Kei Kobayashi

Characterization of Semiconductor Devices Using the Scanning Nonlinear Dielectric Microscopy

Koichiro Honda and Yasuo Cho

New Microscope Combines Optical and Electrical Excitation into a Single Scanning Tunneling Microscope Unit for Simultaneous Characterization of Near-field Luminescence from Individual Nanostructures

Hiroo Omi, Ilya Sychugov, Yoshihiro Kobayashi and Toru Murashita

■ Reviews

Ultrastructural Analysis of the Actin Cytoskeleton in Fission Yeast

Tomoko Kamasaki, Tomoko Takagi, Issei Mabuchi and Masako Osumi

Current Activities on the International Standardizations for the Measurement and Characterization of Nanotechnologies

Toshiyuki Fujimoto and Shingo Ichimura

■ Lectures

Comparison between Various Calculation Methods for Electronic Structure Investigations: Discussion of Chemical Bonding Based on Electron Energy-loss near Edge Structures

Shunsuke Muto and Kazuyoshi Tatsumi

X-ray Micro- and Nano-tomography Techniques and Their Applications

Hiroyuki Toda, Masakazu Kobayashi, Yoshio Suzuki, Akihisa Takeuchi and Kentaro Uesugi

Visualization of Membrane Lipid Molecules at the Nanoscale

Akikazu Fujita and Toyoshi Fujimoto

Machinery and Mechanism of Mycoplasma Gliding

Makoto Miyata

Neurosteroids in the Rat Olfactory Bulb

Emi Kiyokage, Kazunori Toida, Toshiko Yamamoto and Kazunori Ishimura

■ Researches Today

Morphological Diversity of Gap Junctions in the Central Nervous System

Naomi Kamasawa

Observation of Lattice Defects in 4H-SiC Power Devices by Grazing Incident Synchrotron Radiation Topography

Hirofumi Matsuhata, Hirotaka Yamaguchi and Toshiyuki Ohno

Measurement of Local Dielectric Function of LSIs Using TEM-EELS

Yoshihiro Anan, Masanari Koguchi, Kyoichiro Asayama, Koji Kimoto and Yoshio Matsui

Amyotrophic Lateral Screlosis (ALS) and Endoplasmic Reticulum Stress

Taiichi Katayama

■ Conference Reports

The 65th Annual Meeting of the Japanese Society of Microscopy

Terauchi Masami

■ Staff Commentary

Daisuke Fujita