Vol. 44 No. 4 2009
CONTENTS
■ Foreword
Where Does the “Impact Factor” Go ?
Hiroshi Shimoyama
■ Feature Articles: Biological Applications of STEM Tomography
The Marriage of STEM to Electron Tomography
Kazuhiro Aoyama and Atsuo Miyazawa
STEM-Tomography for Thick Biological Specimens
Kazuhiro Aoyama
Quantitative Determination of Beam Irradiation Damages to Biological Specimens Caused by STEM Tomography
Ai Hirase and Atsuo Miyazawa
Dark Field Scanning Transmission Electron Microscopy Imaging Improves Resolution in Tomography of Biological Specimens
Keisuke Ohta, Ryuhei Higashi and Kei-ichiro Nakamura
Structural Analysis of Cell Membranes by Small Convergence Angle HAADF-STEM Tomography
Nobuhiro Morone and Kazuhiro Aoyama
■ Reviews
Atmospheric Scanning Electron Microscope Observes Cells in Solution
Hidetoshi Nishiyama, Mitsuo Suga, Toshihiko Ogura, Yuusuke Maruyama, Mitsuru Koizumi, Kazuhiro Mio, Shinichi Kitamura and Chikara Sato
Surface Plasmon Studied by Transmission Electron Microscopy-Cathodoluminescence Technique
Naoki Yamamoto, Takahiro Suzuki and Kengo Takeuchi
■ Lectures
Heterogeneity of Fusion Phenomena in Maxillo-facial Morphogenesis and Epithelial Cell Differentiation during the Fusion of Palatal Shelves
Toshiya Takigawa
Convergent-beam Electron Diffraction
Kenji Tsuda
■ Researches Today
Identification of the Proliferating Region and Tissue-type Stem Cells in the Lens Epithelium
Naoki Yamamoto
Development of Analytical Electron Microscope Attached with a Microcalorimeter-type EDS — Current State and Future Development —
Toru Hara, Keiichi Tanaka, Keisuke Maehata, Kazuhisa Mitsuda, Noriko Yamasaki, Mitsuaki Ohsaki, Shigemasa Ohta, Katsuaki Watanabe, Xiuzhen Yu, Yoshihiro Yamanaka and Takuji Ito
■ Conference Reports
Report on Microscopy and Microanalysis 2009
Naoya Shibata
Short Report on the Twelfth Frontiers of Electron Microscopy in Materials Science (FEMMS2009)
Syo Matsumura
■ On the occasion of 60th Anniversary of the Japanese Society of Microscopy
■ Staff Commentary
Kaoru Mitsuoka