Vol. 49 No. 3 2014
CONTENTS
■Foreword
Justice Research
Jiro Usukura
■Feature Articles: Frontiers of Serial Slice SEM in BioMedical Research
Frontiers of Serial Slice SEM in Biomedical Research
Kazuyoshi Murata
Advantages of FIB/SEM Tomography in SEM-Based Three-Dimensional Reconstruction
Keisuke Ohta, Tomonoshin Kanazawa and Kei-ichiro Nakamura
Application and Tissue Preparation of SBF-SEM for 3D Ultrastructural Analyses of Biological Specimens
Nobuhiko Ohno, Sei Saitoh, Yurika Saitoh and Shinichi Ohno
Serial Section Scanning Electron Microscopy and Its Application for the Morphological Analysis of the Golgi Apparatus
Daisuke Koga, Satoshi Kusumi and Tatsuo Ushiki
Automated Tape-Collecting System Ultra-Microtome (ATUM) for Three-Dimensional Reconstruction of Biological Tissue
Hirohide Iwasaki
■Reviews
Crystal Structures of Long-Period Stacking Ordered Phase in the Mg-TM-RE System
Kyosuke Kishida and Haruyuki Inui
History and Future Directions of Tract-Tracing Techniques
Yasushi Kobayashi
Mitochondrial Network-Structures Visualized with Scanning Electron Microscopy
Tomonori Naguro, Hironobu Nakane, Sumire Inaga, Toshio Kameie and Toshiyuki Kaidoh
■Lectures
PALM, Superresolution Fluorescence Microscopy Circumventing the Diffraction Limit of Light, to Explore Minute Structures of Cells
Susana Rocha, Herlinde De Keersmaecker, Mitsuhiro Abe, Hiroshi Uji-i, Johan Hofkens, Toshihide Kobayashi, Atsushi Miyawaki and Hideaki Mizuno
Electron Microscopic Analysis of Rice Seed
Takehiro Masumura, Ai Sasou and Yuhi Saito
Depth-Resolution Imaging of Three-Dimensional Nano Structures Using Aberration-Corrected TEM
Jun Yamasaki
■Researches Today
Analysis of Neuronal Circuit Network by Using Synchrotron Radiation at SPring-8
Ryuta Mizutani, Rino Saiga, Akihisa Takeuchi, Kentaro Uesugi, Yasuko Terada and Yoshio Suzuki
Strain Analysis Using STEM Moiré Method
Yukihito Kondo and Noriaki Endo
■From Microscopy: Editor’s Choice Articles
■Conference Reports
The 18th IMC and IFSM School Report
Hideki Masuda
Report on the IMC18 and IFSM School
Chisato Takahashi
■Staff Commentary
Kazuyoshi Murata