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>> Vol.49, No.2, 2014 (Japanese)

Vol. 49  No. 2      2014
CONTENTS

■Foreword

From a View Point out of Microscopy

Kazuo Furuya

■Feature Articles: Improvement and Application of Environmental TEM

In situ TEM Techniques in the Development of New Materials

Takeo Kamino

In situ TEM Observation on Hydrogenation of Hydrogen Storage Materials

Junko Matsuda and Kenta Yoshida

In-situ TEM Observation of Structural Changes of Metal Nanoparticles at High Temperature

Takashi Narushima and Tetsu Yonezawa

In-situ Observation of Nano-Particulate Gold Catalysts by Closed-Type Environmental Transmission Electron Microscope

Tadahiro Kawasaki, Hiroki Murase, Norihiro Imaeda, Cui Zipeng, Takuya Miura, Takaomi Matsutani and Takayoshi Tanji

ETEM Techniques for Development of Energy Related New Materials

Toshie Yaguchi, Takahiro Shimizu and Takeo Kamino

■Reviews

Recent Advances of X-ray Ptychography Technique

Yukio Takahashi

Single Particle Analysis of Replication Fork Complex

Kouta Mayanagi

Electron Microscopic Analyses of Autophagy-Related Organelles in Mammalian Cells

Satoshi Waguri, Takefumi Uemura, Masaya Yamamoto and Atsuko Yabashi

■Lectures

Immunoelectron Microscopy with the Post-Embedding Method Based on Heat-Induced Antigen Retrieval: Techniques and Mechanisms

Shuji Yamashita

High Resolution Electronic State Analysis Using STEM-EELS

Mitsutaka Haruta

■Researches Today

Atomic-Scale Analysis of Cs+ within Zeolitic Framework by AC-(S)TEM and First Principle Calculation

Kaname Yoshida, Kazuaki Toyoura, Katsuyuki Matsunaga, Hiroki Kurata, Atsushi Nakahira, Yumi H. Ikuhara and Yukichi Sasaki

Split-Illumination Electron Holography

Toshiaki Tanigaki, Shinji Aizawa, Hyun Soon Park, Tsuyoshi Matsuda, Ken Harada and Daisuke Shindo

Rapid Three-Dimensional Analysis of Renal Biopsy Paraffin Sections by Low Vacuum SEM

Sumire Inaga, Toshio Kameie, Hironobu Nakane, Tomonori Naguro and Toshiyuki Kaidoh

■From Microscopy: Editor’s Choice Articles

■Conference Reports

Report on the 70th Anniversary Annual Meeting of Japanese Society of Microscopy

Naoya Shibata, Eiji Abe, Masahide Kikkawa and Yuichi Ikuhara

■Staff Commentary

Hidehiro Yasuda